Michael Buschbach

Education

  • University of Minnesota Law School - J.D. 2009, magna cum laude
  • Washington State University - M.S. Computer Science 2005
  • University of Washington - B.S. Computer Engineering 2001

Bar Admissions

  • State of Minnesota
  • United States Patent and Trademark Office

Michael Buschbach

Principal

Technology Areas

  • Software
  • Electrical

Professional Experience

Michael is a patent attorney specializing in patent prosecution matters. Michael joined Shumaker & Sieffert as a law clerk in February, 2008.

Before attending law school, Michael worked as an engineer for Battelle at the Department of Energy’s Environmental Molecular Sciences Laboratory. While there, he collaborated with biologists, biochemists and physicists to create, implement, and support the use of state-of-the-art custom robotics, instrumentation and software to facilitate novel experimental methods. Michael has consulted with and completed projects for clients in the U.S. Department of Energy, the U.S. Department of Homeland Security, the National Institutes of Health, and other federal agencies.

He was a managing editor on the University of Minnesota Law School Journal of Law, Science & Technology.

Publications

  • "Incorporating Indefiniteness," February 2016
  • Note, An Improved Framework for Analyzing 'Substantially Similar' Patent Claims with Respect to the Inequitable Conduct Defense, Minnesota Journal of Law, Science and Technology, Volume 10, Issue 2 (2009).
  • K. Tang, A.A. Shvartsburg, H.N. Lee, D.C. Prior, M.A. Buschbach, F.M. Li, A.V. Tolmachev, G.A.Anderson, R.D. Smith, "High-Sensitivity Ion Mobility Spectrometry/Mass Spectrometry Using Electrodynamic Ion Funnel Interfaces." Analytical Chemistry, 77 (2005), pp. 3330-3339.
  • M. E. Belov, M. A. Buschbach, D. C. Prior, K. Tang, R. D. Smith, "Multiplexed ion mobility spectrometry-orthogonal time-of-flight mass spectrometry," Analytical Chemistry, 79 (2007), 79, 2451–2462.
  • D.F. Hopkins, L.M. Alexander, K.R. Swanson, M.A. Buschbach, "Control System for an Ion Trap Mass Spectrometer," Scientific Computing & Instrumentation (2004):18-20. 21.